Eighteen mega-electron-volt alpha-particle damage in homoepitaxial β-Ga2O3 Schottky rectifiers
2018 · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
저자
Jiancheng Yang, Chaker Fares, Yu Min Guan, Fan Ren, S. J. Pearton, Jinho Bae, 김지현 (Jihyun Kim), Akito Kuramata
연구주제
Ga2O3 and related materials · Radiation Effects in Electronics
NTIS 과학기술표준분류
가장 가까운 분류(전기/전자 > 반도체 소자·회로 > 화합물소자)가 화학·화공 범위 밖이다. 배정 근거: AI 키워드가 잡은 NTIS 과제의 분류.
AI 연구 키워드·방법
알파 입자 조사 베타 산화갈륨(β-Ga2O3) 캐리어 제거율 쇼트키 다이오드
키워드 (OpenAlex)
β-Ga2O3 Schottky rectifiers alpha particle irradiation radiation damage carrier removal rate reverse breakdown voltage on/off current ratio reverse recovery
초록
Homoepitaxial Ga2O3 rectifiers with vertical geometry were subject to 18 MeV alpha particle irradiation at fluences of 1012–1013 cm−2, simulating space radiation exposure. The range of these particles (∼80 μm) is much greater than the drift layer thickness in the structures (∼7 μm). The carrier removal rates were in the range of 406–728 cm−1 for these conditions. These values are factors of 2–3 higher than for high energy (10 MeV) protons and 2 orders of magnitude higher than for 1.5 MeV electron irradiation of the same material. The on-state resistance of the rectifiers is more degraded by alpha particle irradiation than either ideality factor or barrier height. The reverse breakdown voltage of the rectifiers increases with alpha particle dose as carriers in the drift region are removed by trapping into traps created by the radiation damage. The on/off ratio of the rectifiers was severe…
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