High reverse breakdown voltage Schottky rectifiers without edge termination on Ga2O3
2017 · Applied Physics Letters
저자
Jiancheng Yang, Shihyun Ahn, Fan Ren, S. J. Pearton, Soohwan Jang, 김지현 (Jihyun Kim), Akito Kuramata
연구주제
NTIS 과학기술표준분류
가장 가까운 분류(전기/전자 > 반도체 소자·회로 > 반도체 재료)가 화학·화공 범위 밖이다. 배정 근거: AI 키워드가 잡은 NTIS 과제의 분류.
AI 연구 키워드·방법
베타 산화갈륨(β-Ga2O3) hydride vapor phase epitaxy reverse breakdown voltage 쇼트키 다이오드
키워드 (OpenAlex)
β-Ga2O3 Schottky rectifiers reverse breakdown voltage Ni/Au contacts hydride vapor phase epitaxy Schottky barrier height ideality factor on-resistance
초록
Vertical geometry Ni/Au-β-Ga2O3 Schottky rectifiers were fabricated on Hydride Vapor Phase Epitaxy layers on conducting bulk substrates, and the rectifying forward and reverse current-voltage characteristics were measured at temperatures in the range of 25–100 °C. The reverse breakdown voltage (VBR) of these β-Ga2O3 rectifiers without edge termination was a function of the diode diameter, being in the range of 920–1016 V (average value from 25 diodes was 975 ± 40 V, with 10 of the diodes over 1 kV) for diameters of 105 μm and consistently 810 V (810 ± 3 V for 22 diodes) for a diameter of 210 μm. The Schottky barrier height decreased from 1.1 at 25 °C to 0.94 at 100 °C, while the ideality factor increased from 1.08 to 1.28 over the same range. The figure-of-merit (VBR2/Ron), where Ron is the on-state resistance (∼6.7 mΩ cm2), was approximately 154.07 MW·cm−2 for the 105 μm diameter diodes…
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