SNU CBE

Review—Radiation Damage in Wide and Ultra-Wide Bandgap Semiconductors

2021 · ECS Journal of Solid State Science and Technology

저자

S. J. Pearton, Assel Aitkaliyeva, Minghan Xian, Fan Ren, Ani Khachatrian, Adrian Ildefonso, Zahabul Islam, Md Abu Jafar Rasel, Aman Haque, Alexander Y. Polyakov, 김지현 (Jihyun Kim)

연구주제

Radiation Effects in Electronics · Ga2O3 and related materials

NTIS 과학기술표준분류

가장 가까운 분류(전기/전자 > 반도체 소자·회로 > 화합물소자)가 화학·화공 범위 밖이다. 배정 근거: AI 키워드가 잡은 NTIS 과제의 분류.

AI 연구 키워드·방법

질화갈륨(GaN) radiation damage silicon carbide 와이드밴드갭 반도체

키워드 (OpenAlex)

radiation damage wide bandgap semiconductors ultra-wide bandgap semiconductors silicon carbide gallium nitride gallium oxide diamond boron nitride

초록

The wide bandgap semiconductors SiC and GaN are already commercialized as power devices that are used in the automotive, wireless, and industrial power markets, but their adoption into space and avionic applications is hindered by their susceptibility to permanent degradation and catastrophic failure from heavy-ion exposure. Efforts to space-qualify these wide bandgap power devices have revealed that they are susceptible to damage from the high-energy, heavy-ion space radiation environment (galactic cosmic rays) that cannot be shielded. In space-simulated conditions, GaN and SiC transistors have shown failure susceptibility at ∼50% of their nominal rated voltage. Similarly, SiC transistors are susceptible to radiation damage-induced degradation or failure under heavy-ion single-event effects testing conditions, reducing their utility in the space galactic cosmic ray environment. In SiC-b…

이 논문을 지원한 국가R&D 과제 (NTIS 성과)

연도과제부처사업수행기관NTIS 분류(1순위)
2021PFC 가스 대체용 Fluoro-ether 및 Fluoro-alcohol 계열 Precursor를 이용한 식각공정 기술 개발산업통상자원부에너지수요관리핵심기술개발(에특)(R&D)아주대학범위 밖

인접 그래프

노드 hover = 이웃 강조 · 1회 클릭 = 고정 · 고정된 노드 다시 클릭 = 페이지 이동

이 문서와 연결된 페이지

교수 1

김지현

연구주제 1

Radiation Effects in Electronics

키워드 2

와이드밴드갭 반도체 · 질화갈륨(GaN)