Electric Field-Assisted Agglomeration of Trace Nanoparticle Impurities for Ultrahigh Purity Chemicals
2024 · JACS Au
저자
Dongryul Lee, Dong-Gyu Lee, Sungjune Lee, Hee Jeong Park, Kuk Nam Han, Sam-Jong Choi, Yun Ho Kim, 김지현 (Jihyun Kim)
연구주제
Electrostatics and Colloid Interactions
NTIS 과학기술표준분류
가장 가까운 분류(재료 > 소성가공/분말 > 분말가공기술)가 화학·화공 범위 밖이다. 배정 근거: AI 키워드가 잡은 NTIS 과제의 분류.
AI 연구 키워드·방법
dielectrophoretic agglomeration 나노입자 불순물 제거 semiconductor processing chemical silicate nanoparticle
키워드 (OpenAlex)
silicate nanoparticles silicon nanoparticles AC electric field trace impurity removal semiconductor manufacturing acidic media particle size distribution
초록
With the advancement of semiconductor manufacturing technology, the effects of trace impurities in industrial chemicals have grown significantly. In industrial processes, conventional purification methods, such as filtration and distillation, have reached their limits for removing nanoparticles from aqueous and acidic solutions. Especially, silicon and silicate are two fundamental byproducts in semiconductor fabrication processes. Assembly and subsequent removal of these materials at the nanoparticle level have been confronted with significant challenges. Therefore, it is imperative to develop technologies to effectively control and remove these impurities for next-generation manufacturing processes. In this study, we explored the use of electric field-assisted assembly to agglomerate silicate and silicon nanoparticles in industry-standard aqueous and acidic solutions. By applying an alt…
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교수 1
연구주제 1
Electrostatics and Colloid Interactions