SNU CBE

Photo-Enhanced Acid Chemical Etching of High-Quality Aluminum Nitride Grown by Metal-Organic Chemical Vapor Deposition

2019 · ECS Journal of Solid State Science and Technology

저자

Yong ha Choi, Kwang Hyeon Baik, Rak-Jun Choi, Jeong-Tak Oh, 김지현 (Jihyun Kim)

연구주제

GaN-based semiconductor devices and materials · Semiconductor materials and devices

NTIS 과학기술표준분류

가장 가까운 분류(재료 > 세라믹재료 > 단결정)가 화학·화공 범위 밖이다. 배정 근거: AI 키워드가 잡은 NTIS 과제의 분류.

AI 연구 키워드·방법

질화알루미늄(AlN) crystal facet evolution phosphoric acid etching photo enhanced wet etching

유기금속 화학기상증착(MOCVD)

키워드 (OpenAlex)

aluminum nitride phosphoric acid etching wurtzite AlN electron-hole pair generation activation energy etch rate surface morphology control hexagonal columns

초록

Photo-enhanced chemical (PEC) etch of wurtzite aluminum nitride (AlN) was investigated to overcome its low etch rate. Epitaxial AlN grown on Al 2 O 3 substrate by metal-organic chemical vapor deposition method was immersed in phosphoric acid at different temperatures under 185 nm deep-UV excitation. An inverted pyramid structure with {10-1-1} faces initially appeared, after chemical etching, evolving into hexagonal columns with {1-100} m-planes. The PEC etch rate of m-plane AlN was six-fold higher than that of non-PEC one because the reaction was enhanced by the electron-hole pairs photo-generated by 185 nm wavelength. The decrease of the activation energy from 68.5 kJ/mol (non-PEC etch) to 48.1 kJ/mol (PEC etch) was extracted, implying a reaction-limited etching process. The PEC etch mechanism of wurtzite AlN in phosphoric acid was proposed, including the initiation and growth of the et…

이 논문을 지원한 국가R&D 과제 (NTIS 성과)

NTIS 성과DB(2020–24)에서 DOI 매칭 없음

인접 그래프

노드 hover = 이웃 강조 · 1회 클릭 = 고정 · 고정된 노드 다시 클릭 = 페이지 이동

이 문서와 연결된 페이지

교수 1

김지현

연구주제 1

GaN-based semiconductor devices and materials

키워드 1

질화알루미늄(AlN)

방법 1

유기금속 화학기상증착(MOCVD)