Self-Explanatory Fault Diagnosis Framework for Industrial Processes Using Graph Attention
2025 · IEEE Transactions on Industrial Informatics
저자
Chae Sun Kim, Han Kim, 이종민 (Jong Min Lee)
연구주제
Fault Detection and Control Systems
NTIS 과학기술표준분류
가장 가까운 분류(기계 > 자동차/철도차량 > 차체/경량화기술)가 화학·화공 범위 밖이다. 배정 근거: AI 키워드가 잡은 NTIS 과제의 분류.
AI 연구 키워드·방법
explainable ai 공정 고장 진단 근본 원인 분석
graph attention network
키워드 (OpenAlex)
fault diagnosis industrial processes graph attention networks explainable AI root cause identification fault classification
초록
Explanations of deep learning fault diagnosis models have been crucial for risk management and subsequent maintenance actions. Furthermore, purely data-driven approaches for fault diagnosis in industrial processes, without integrating process knowledge or guidance, are limited in generalization ability. This article proposes a graph-based self-explanatory fault diagnosis model. The model employs a graph attention mechanism on a constructed graph data representation of the industrial process, facilitating to capture the causal relationships between process variables. Once the model is fully trained, variations in attention coefficients from normal operating condition are used to identify the root cause of the faulty scenario. This self-explanatory methodology elucidates the model's actual reasoning, obviating the need for additional separate explainable AI methods. Validations through ben…
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교수 1
연구주제 1
Fault Detection and Control Systems